Extracting Elastic Properties of Heterogeneous Layered Materials using Atomic Force Microscopy (AFM)
نویسندگان
چکیده
منابع مشابه
Application of Atomic Force Microscopy (AFM) in Polymer Materials
Atomic force microscopy (AFM) is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution. AFM is extremely useful for studying the local surface molecular composition and mechanical properties of a broad range of polymer materials, including block copolymers, bulk polymers, thin-film polymers, polymer composites, and polymer...
متن کاملNanoprocessing of layered crystalline materials by atomic force microscopy
By taking advantage of the mechanical anisotropy of crystalline materials, processing at a single-layer level can be realized for layered crystalline materials with periodically weak bonds. Mica (muscovite), graphite, molybdenum disulfide (MoS2), and boron nitride have layered structures, and there is little interaction between the cleavage planes existing in the basal planes of these materials...
متن کاملComprehensive Compositional Imaging of Heterogeneous Materials with Atomic Force Microscopy
Distinguishing of individual constituents in complex materials is one of the primary tasks of microscopy that is achieved by visualization of specific shapes and features of components. Electron microscopy and atomic force microscopy (AFM) [1] extend visualization of objects down to the atomic scale thus enhancing compositional imaging. The situation becomes less trivial when the constituents l...
متن کاملElastic properties of living fibroblasts as imaged using force modulation mode in atomic force microscopy.
Using the force modulation mode in atomic force microscopy, we measured elastic properties of living mouse fibroblasts (NIH3T3) in a culture medium. The topographic images of the cellular surface and the corresponding elastic images of the cellular surface were able to be captured simultaneously with high spatial resolution. The consecutive images were useful for examining time-dependent change...
متن کاملIn-Process Atomic-Force Microscopy (AFM) Based Inspection
A new in-process atomic-force microscopy (AFM) based inspection is presented for nanolithography to compensate for any deviation such as instantaneous degradation of the lithography probe tip. Traditional method used the AFM probes for lithography work and retract to inspect the obtained feature but this practice degrades the probe tip shape and hence, affects the measurement quality. This pape...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Biophysical Journal
سال: 2013
ISSN: 0006-3495
DOI: 10.1016/j.bpj.2012.11.2833